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表面声波(SAW)装置用单晶薄片.规格和测量方法(IEC 62276-2012).德文版本EN 62276-2013
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013
参考页数：43P;A4
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频率控制和选择用表面安装的压电器件.标准外形和终端引线的连接.第1部分:塑料模压外壳外形(IEC 61837-1-2012).德文版本EN 61837-1-2012
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines (IEC 61837-1:2012); German version EN 61837-1:2012
参考页数：24P;A4
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压电装置.频率控制和选择用表面安装装置(SMD)框图的制备.通用规则(IEC 61240-2012).德文版本EN 61240-2012
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (IEC 61240:2012); German version EN 61240:2012
参考页数：19P.;A4
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经质量评估的石英晶体受控振荡器.第3部分:标准外形和引线连接件(IEC 60679-3-2012).德文版本EN 60679-3-2013
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 60679-3:2012); German version EN 60679-3:2013
参考页数：26P;A4
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符合评估质量的表面声波 (SAW) 过滤器. 第2部分:使用指南 (IEC 60862-2-2012); 德文版本EN 60862-2-2012
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use (IEC 60862-2:2012); German version EN 60862-2:2012
参考页数：60P.;A4
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经质量评估的石英晶体元件.第3部分:标准外形和引线连结件(IEC 60122-3-2010).德文版本EN 60122-3-2010
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections (IEC 60122-3:2010); German version EN 60122-3:2010
参考页数：25P.;A4
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质量评定的石英晶体控制振荡器.第6部分:石英晶体振荡器和SAW振荡器的相位抖动测量方法.应用指南(IEC 60679-6-2011).德文版 EN 60679-6-2011
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011); German version EN 60679-6:2011
参考页数：21P;A4
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石英振荡器参数的测量.第11部分:负载共振频率fL和有效负载电容CLeff使用自动网络分析技术和误差修正的测定用标准方法(IEC 60444-11-2010).德文版本EN 60444-11-2010
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<(Index)L> and the effective load capacitance C<(Index)Leff> using automatic network analyzer techniques and error correction (IEC 60444-11:2010); German version EN 60444-11:2010
参考页数：16P;A4
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用π型网络的零相位技术测量石英晶体单元的参数.第1部分:用π型网络的零相位技术测量石英晶体单元的谐振频率和谐振阻抗
Measurement of quartz crystal unit parameters by zero phase technique in a -network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network (IEC 60444-1:1986 + A1:1999); German version EN 60444-1:1997 + A1:1999
参考页数：26P.;A4
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用π型网络的零相位技术测量石英晶体元件参数.第2部分:相位偏离法测量石英晶体元件动态电容
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
参考页数：9P.;A4
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