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测量电子器件辐射硬化试验中吸收剂量的热致发光剂量测量 (TLD) 系统应用的标准实施规程
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
参考页数：19P.;A4
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X射线测试仪使用标准指南(&x2248;10 keV光子)用于半导体器件和微电路的电离辐射效应测试
Standard Guide for Use of an X-Ray Tester (&x2248;10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
参考页数：18P.;A4
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评定硅电子器件辐射强度试验用钴60辐射源的低能伽马成分的电离箱应用的标准试验方法
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
参考页数：10P.;A4
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采用旋转芯轴弯曲评估柔性电路上表面安装设备 (SMD) 连接可靠性的标准试验方法
Standard Test Method for Evaluating the Reliability of Surface Mounted Device (SMD) Joints on a Flexible Circuit by a Rolling Mandrel Bend
参考页数：3P.;A4
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Methods for providing information relating to material efficiency aspects of energy-related products; German version EN 45559:2019
参考页数：30P.;A4
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General method to declare the use of critical raw materials in energy-related products; German version EN 45558:2019
参考页数：37P.;A4
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静电学. 第5-4部分: 静电现象中电子设备的防护. 符合性验证
Electrostatics - Part 5-4: Protection of electronic devices from electrostatic phenomena - Compliance verification
参考页数：78P.;A4
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电阻器和电容器标志代码
Marking codes for resistors and capacitors
参考页数：132P.;A4
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电阻器和电容器标志代码. 修改件1
Marking codes for resistors and capacitors; Amendment 1
参考页数：9P.;A4
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光学和光子学. 全息摄影术. 第2部分: 全息记录特性的测量方法
Optics and photonics - Holography - Part 2: Methods for measurement of hologram recording characteristics
参考页数：20P.;A4
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